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Simple to use -
easily programmed, de-skills testing, reduces labor costs |
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Single Push bush button operation
- speeds testing, increases productivity |
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Fully automated test sequences
- operator just loads and removes transformers |
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Comprehensive sequential tests
- precise accurate and reliable results |
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Date collection and analysis
- online statistic, RS-232, GPIB data link |
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System fully password protected - secure, tamper-proof programs |
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Fixture service available |
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Model |
5235 |
5236 |
5237 |
Frequency |
200K |
500K |
1M |
Test Parameter |
¡¡ |
Transformer
Scanning |
Turn Ratio, Phase, L, Q, Leakage L,
Balance, ACR, Cp, D, X, Y, DCR, Pin Short |
Test Signals Information |
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Test Frequency (0.01%, 5digits) |
Turn |
1kHz~200kHz |
1kHz~500kHz |
1kHz~1MHz |
Others |
20Hz~200kHz |
20Hz~500kHz |
20Hz~1MHz |
Output Impedance |
100¥Ø |
Measurement
Range |
L, LK |
0.00001uH~9999.99H |
C |
1pF~999.99mF |
Q, D |
0.00001~99999 |
Z, X, R |
0.00001¥Ø~99.9999M¥Ø |
Y |
0.01nS~99.9999S |
¥è |
-90.00º~+90.00º |
DCR |
0.01m¥Ø~99.999M¥Ø |
Turn |
0.01~99999.99turns |
Pin-Short |
12 pairs, between pin to pin |
Basic
Accuracy |
L, LK, C, Z, X, Y, R, DCR |
0.1% (1kHz if AC parameter) |
Q, D |
0.0005 (1kHz) |
¥è |
0.03º (1kHz) |
Turn |
0.5% (1kHz) |
Measurement Speed
(Fastest) |
L, LK, C, Z, X, Y, R, DCR |
75ms |
DCR |
30m/s |
Turn |
75ms |
Judge |
Transformer Scanning |
PASS/FAIL judge of all test
parameters output from optional HANDLER interface |
Test Channel |
80 Channels |
Trigger |
Internal, Manual, External |
Display |
320*240 dot-matrix LCD display |
Equivalent Circuit Mode |
Series, Parallel |
Correction Function |
Open/Short Zeroing, Load deviatiom |
Memory |
60 instrument setups |
General |
Operation Environment |
Temperature :10ºC ~ 40ºC, Humidity :10%~90%
RH |
Power Consumption |
140VA max. |
Power Requirement |
90Vac~125Vac or 190Vac~250Vac,
48Hz~62Hz |
Weight |
Approx. 9kg |
Dimension (W*H*D) |
480*180*320mm |
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